Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures

Reimann F, Glaß M, Teich J, Cook A, Gomez LR, Ull D, Wunderlich HJ, Engelke P, Abelein U (2014)


Publication Type: Conference contribution

Publication year: 2014

Publisher: ACM Press

Edited Volumes: Proceedings - Design Automation Conference

City/Town: New York, NY, USA

Pages Range: 8

Conference Proceedings Title: Proc. of The 51st Annual Design Automation Conference (DAC)

Event location: San Francisco, CA US

ISBN: 978-1-4799-3017-3

DOI: 10.1145/2593069.2602971

Abstract

The constantly growing amount of semiconductors in au-tomotive systems increases the number of possible defect mechanisms, and therefore raises also the effort to main-tain a sufficient level of quality and reliability. A promising solution to this problem is the on-line application of struc-tural tests in key components, typically ECUs. In this work, an approach for the optimized integration of both Software-Based Self-Tests (SBST) and Built-In Self-Tests (BIST) into E/E architectures is presented. The approach integrates the execution of the tests non-intrusively, i. e., it (a) does not af-fect functional applications and (b) does not require costly changes in the communication schedules or additional com-munication overhead. Via design space exploration, opti-mized implementations with respect to multiple con icting objectives, i. e., monetary costs, safety, test quality, and re-quired execution time are derived. Copyright 2014 ACM.

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How to cite

APA:

Reimann, F., Glaß, M., Teich, J., Cook, A., Gomez, L.R., Ull, D.,... Abelein, U. (2014). Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures. In Proc. of The 51st Annual Design Automation Conference (DAC) (pp. 8). San Francisco, CA, US: New York, NY, USA: ACM Press.

MLA:

Reimann, Felix, et al. "Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures." Proceedings of the The 51st Annual Design Automation Conference (DAC), San Francisco, CA New York, NY, USA: ACM Press, 2014. 8.

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