Recap of the 2016 DATE Conference & Exhibition

Fanucci L, Teich J (2016)

Publication Type: Journal article

Publication year: 2016

Journal

IEEE Design and Test of Computers Institute of Electrical and Electronics Engineers (IEEE)

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Book Volume: 33

Pages Range: 114-117

Journal Issue: 4

DOI: 10.1109/MDAT.2016.2570223

Authors with CRIS profile

Jürgen Teich Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)

Involved external institutions

University of Pisa / Università di Pisa (UniPi) IT Italy (IT)

How to cite

APA:

Fanucci, L., & Teich, J. (2016). Recap of the 2016 DATE Conference & Exhibition. IEEE Design and Test of Computers, 33(4), 114-117. https://doi.org/10.1109/MDAT.2016.2570223

MLA:

Fanucci, Luca, and Jürgen Teich. "Recap of the 2016 DATE Conference & Exhibition." IEEE Design and Test of Computers 33.4 (2016): 114-117.

BibTeX: Download