Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures

Abelein U, Cook A, Engelke P, Glaß M, Reimann F, Gómez LR, Russ T, Teich J, Ull D, Wunderlich HJ (2014)

Publication Type: Conference contribution

Publication year: 2014

Publisher: IEEE Press

Edited Volumes: Proceedings -Design, Automation and Test in Europe, DATE

City/Town: New York, NY, USA

Pages Range: 6

Conference Proceedings Title: Proc. of Design, Automation and Test in Europe (DATE)

Event location: Dresden DE

ISBN: 978-3-9815370-2-4

DOI: 10.7873/DATE2014.373

Abstract

With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is quite cost-driven, structural diagnosis shall not deteriorate traditional design objectives. With this goal in mind, the work at hand proposes a design space exploration to integrate structural diagnostic capabilities into an E/E-architecture design. The proposed integration is performed non-intrusively, i. e., the addition and execution of tests (a) does not affect any functional applications and (b) does not require any costly changes in the communication schedules. © 2014 EDAA.

Authors with CRIS profile

Michael Glaß Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) Felix Reimann Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) Jürgen Teich Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)

Involved external institutions

Universität Stuttgart DE Germany (DE) Audi AG DE Germany (DE) Infineon Technologies AG DE Germany (DE)

How to cite

APA:

Abelein, U., Cook, A., Engelke, P., Glaß, M., Reimann, F., Gómez, L.R.,... Wunderlich, H.J. (2014). Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures. In Proc. of Design, Automation and Test in Europe (DATE) (pp. 6). Dresden, DE: New York, NY, USA: IEEE Press.

MLA:

Abelein, Ulrich, et al. "Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures." Proceedings of the Design, Automation and Test in Europe (DATE), Dresden New York, NY, USA: IEEE Press, 2014. 6.

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