Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems

Aliee H, Vitzethum S, Glaß M, Teich J, Borgonovo E (2016)

Publication Type: Conference contribution

Publication year: 2016

Pages Range: 53-56

Conference Proceedings Title: Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and

Event location: Connecticut US

Authors with CRIS profile

Hananeh Aliee Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) Michael Glaß Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) Jürgen Teich Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)

Involved external institutions

Università Commerciale Luigi Bocconi IT Italy (IT)

How to cite

APA:

Aliee, H., Vitzethum, S., Glaß, M., Teich, J., & Borgonovo, E. (2016). Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems. In Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and (pp. 53-56). Connecticut, US.

MLA:

Aliee, Hananeh, et al. "Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems." Proceedings of the 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Connecticut 2016. 53-56.

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