Tausch N, Philippsen M, Adersberger J (2012)
Publication Language: English
Publication Type: Conference contribution, Original article
Publication year: 2012
Publisher: IEEE CPS
Edited Volumes: Proceedings of the 2012 Joint Working Conference on Software Architecture and 6th European Conference on Software Architecture, WICSA/ECSA 2012
City/Town: Los Alamitos, CA
Pages Range: 320-325
Conference Proceedings Title: Proceedings of the 2012 Joint Working Conference on Software Architecture & 6th European Conference on Software Architecture
Event location: Helsinki, Finland
ISBN: 978-0-7695-4827-2
DOI: 10.1109/WICSA-ECSA.212.53
Traceability analysis is used to improve quality in the software development process. As such an analysis is complex to implement and often requires a lot of dense code that is specific to the system being traced, there is a need for a framework to express traceability analysis tasks. This paper presents the Traceability Query Language TracQL, an expressive, extensible, representation-independent, and fast domain-specific language. Known approaches do not fulfill all these requirements. We examine TracQL and compare it to other approaches on a software ageing problem, namely to detect divergence between architecture and code. The necessary TracQL code is much shorter (by a factor of 1.7) and about twice as fast as what known approaches can achieve.
APA:
Tausch, N., Philippsen, M., & Adersberger, J. (2012). TracQL: A Domain-Specific Language for Traceability Analysis. In Ali Babar M., Cuesta C., Savolainen J., Männistö T. (Eds.), Proceedings of the 2012 Joint Working Conference on Software Architecture & 6th European Conference on Software Architecture (pp. 320-325). Helsinki, Finland, FI: Los Alamitos, CA: IEEE CPS.
MLA:
Tausch, Norbert, Michael Philippsen, and Josef Adersberger. "TracQL: A Domain-Specific Language for Traceability Analysis." Proceedings of the Joint Working Conference on Software Architecture & 6th European Conference on Software Architecture (WICSA/ECSA 2012), Helsinki, Finland Ed. Ali Babar M., Cuesta C., Savolainen J., Männistö T., Los Alamitos, CA: IEEE CPS, 2012. 320-325.
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