Fast image processing for optical metrology utilizing heterogeneous computer architectures

Reichenbach M, Seidler R, Pfundt B, Fey D (2013)

Publication Type: Journal article

Publication year: 2013

Journal

Computers & Electrical Engineering Elsevier

Publisher: Elsevier

URI: http://www.sciencedirect.com/science/article/pii/S0045790613002474

DOI: 10.1016/j.compeleceng.2013.09.008

Authors with CRIS profile

Marc Reichenbach Lehrstuhl für Informatik 3 (Rechnerarchitektur) Benjamin Pfundt Lehrstuhl für Informatik 3 (Rechnerarchitektur) Dietmar Fey Lehrstuhl für Informatik 3 (Rechnerarchitektur)

How to cite

APA:

Reichenbach, M., Seidler, R., Pfundt, B., & Fey, D. (2013). Fast image processing for optical metrology utilizing heterogeneous computer architectures. Computers & Electrical Engineering. https://doi.org/10.1016/j.compeleceng.2013.09.008

MLA:

Reichenbach, Marc, et al. "Fast image processing for optical metrology utilizing heterogeneous computer architectures." Computers & Electrical Engineering (2013).

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