Measurement of the magnetization of thin-film samples subjected to mechanical stress

Löffler M, Piepgras R, Sutor A, Lerch R (2014)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2014

Pages Range: 55-59

Conference Proceedings Title: Proceedings

Event location: Benevento IT

ISBN: 978-92-990073-2-7

Abstract

This contribution proposes a method to mea-
sure the magnetization of ferromagnetic thin-film sam-
ples subjected to mechanical stress. We present our
Vector Vibrating Sample Magnetometer and two fix-
tures that enable the adjustable bending of the ferro-
magnetic samples during the magnetization measure-
ment. The bending, in turn, results in internal stresses.
According to the magnetoelastic effect, the magneti-
zation of ferromagnetic materials depends on internal
mechanical stress. Results of two Fe 49 Co 49 V 2 samples
are shown which prove the applicability of the proposed
method.

Authors with CRIS profile

Michael Roas-Löffler Lehrstuhl für Autonome Systeme und Mechatronik Alexander Sutor Lehrstuhl für Autonome Systeme und Mechatronik Reinhard Lerch Lehrstuhl für Autonome Systeme und Mechatronik

How to cite

APA:

Löffler, M., Piepgras, R., Sutor, A., & Lerch, R. (2014). Measurement of the magnetization of thin-film samples subjected to mechanical stress. In Proceedings (pp. 55-59). Benevento, IT.

MLA:

Löffler, Michael, et al. "Measurement of the magnetization of thin-film samples subjected to mechanical stress." Proceedings of the 20th IMEKO TC-4 International Symposium on Research on Electrical and Electronic Measurement for the Economic Upturn, Benevento 2014. 55-59.

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