Classen A, Ayyer K, Chapman HN, Roehlsberger R, von Zanthier J (2017)
Publication Status: Published
Publication Type: Journal article
Publication year: 2017
Publisher: AMER PHYSICAL SOC
Book Volume: 119
Article Number: 053401
Journal Issue: 5
DOI: 10.1103/PhysRevLett.119.053401
Established x-ray diffraction methods allow for high-resolution structure determination of crystals, crystallized protein structures, or even single molecules. While these techniques rely on coherent scattering, incoherent processes like fluorescence emission-often the predominant scattering mechanism-are generally considered detrimental for imaging applications. Here, we show that intensity correlations of incoherently scattered x-ray radiation can be used to image the full 3D arrangement of the scattering atoms with significantly higher resolution compared to conventional coherent diffraction imaging and crystallography, including additional three-dimensional information in Fourier space for a single sample orientation. We present a number of properties of incoherent diffractive imaging that are conceptually superior to those of coherent methods.
APA:
Classen, A., Ayyer, K., Chapman, H.N., Roehlsberger, R., & von Zanthier, J. (2017). Incoherent Diffractive Imaging via Intensity Correlations of Hard X Rays. Physical Review Letters, 119(5). https://doi.org/10.1103/PhysRevLett.119.053401
MLA:
Classen, Anton, et al. "Incoherent Diffractive Imaging via Intensity Correlations of Hard X Rays." Physical Review Letters 119.5 (2017).
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