In situ structural changes of amorphous diopside (CaMgSi2O6) up to 20 GPa: A Raman and O K-edge X-ray Raman spectroscopic study

Moulton BJA, Henderson GS, Fukui H, Hiraoka N, de Ligny D, Sonneville C, Kanzaki M (2016)


Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2016

Journal

Publisher: Meteoritical Society

Book Volume: 178

Pages Range: 41-61

DOI: 10.1016/j.gca.2016.01.020

Abstract

XRS measurements at the O K-edge suggest that Si-[5] is formed by 3 GPa. This formation is accompanied by a rapid decrease in the /Si-O-Si and a decrease in Q(0) species. A linear increase in the geometric mean of the high frequency envelope, the chi(b) value, from 999 to 1018 cm(-1) suggests that the conversion of NBO to BO is continuous up to 14 GPa. Above 14 GPa, the Raman spectra show an obvious negative shift in both, the high frequency peak maximum, and the chi(b) position. Simultaneously, the low frequency envelope looses its asymmetry at 14 GPa. This may be explained by either a loss of a vibrational mode in the range 1000-1200 cm(-1) and/or the formation of Si-[6]. The structural evolution of CaMgSi2O6 correlates well with a major change in the compressibility and diffusivity around 5 GPa. (C) 2016 Elsevier Ltd. All rights reserved.

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APA:

Moulton, B.J.A., Henderson, G.S., Fukui, H., Hiraoka, N., de Ligny, D., Sonneville, C., & Kanzaki, M. (2016). In situ structural changes of amorphous diopside (CaMgSi2O6) up to 20 GPa: A Raman and O K-edge X-ray Raman spectroscopic study. Geochimica Et Cosmochimica Acta, 178, 41-61. https://doi.org/10.1016/j.gca.2016.01.020

MLA:

Moulton, Benjamin J. A., et al. "In situ structural changes of amorphous diopside (CaMgSi2O6) up to 20 GPa: A Raman and O K-edge X-ray Raman spectroscopic study." Geochimica Et Cosmochimica Acta 178 (2016): 41-61.

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