Besold S, Hoyer U, Bachmann J, Swonke T, Schilinsky P, Steim R, Brabec C (2014)
Publication Language: English
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2014
Publisher: Elsevier
Book Volume: 124
Pages Range: 133-137
DOI: 10.1016/j.solmat.2014.01.030
Thermographic methods are widely established to detect shunts in photovoltaic technologies. In all methods the cell has to be directly accessible to determine quantitative shunt values. In this manuscript a precise method is presented to determine shunt values in solar modules consisting of series connected bulk-heterojunction organic solar cells without the need to access the single cells separately. It will be shown that, although parallel resistances in organic solar cells show a strong dependence on the illumination intensity, the shunts that are detected using illuminated lock-in-thermography are strongly ohmic and therefore can be assigned a distinct ohm value. (c) 2014 Elsevier B.V. All rights reserved.
APA:
Besold, S., Hoyer, U., Bachmann, J., Swonke, T., Schilinsky, P., Steim, R., & Brabec, C. (2014). Quantitative imaging of shunts in organic photovoltaic modules using lock-in thermography. Solar Energy Materials and Solar Cells, 124, 133-137. https://doi.org/10.1016/j.solmat.2014.01.030
MLA:
Besold, S., et al. "Quantitative imaging of shunts in organic photovoltaic modules using lock-in thermography." Solar Energy Materials and Solar Cells 124 (2014): 133-137.
BibTeX: Download