Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence

Künecke U, Hetzner C, Möckel S, Yoo HS, Hock R, Wellmann P (2015)

Publication Language: English

Publication Status: Published

Publication Type: Journal article

Publication year: 2015

Journal

Thin Solid Films Elsevier

Publisher: Elsevier

Book Volume: 582

Pages Range: 387-391

DOI: 10.1016/j.tsf.2014.10.063

Abstract

We report on the microstructure analysis of kesterite (Cu2ZnSnSe4) layers from rapid thermal processing of sequential elemental layers by spatially resolved cathodoluminescence in a scanning electron microscope. Energy dispersive X-ray fluorescence, X-ray diffraction and Raman spectroscopy were carried out for the validation of the findings. Special emphasis is put on the discussion of the occurrence of the secondary phases Cu2SnSe3, Cu2Se, ZnSe and SnSe. (C) 2014 Elsevier B.V. All rights reserved.

Authors with CRIS profile

Ulrike Künecke Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik) Stefan Möckel Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik) Hye Sun Yoo Professur für Kristallographie und Strukturphysik Rainer Hock Professur für Kristallographie und Strukturphysik Peter Wellmann Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)

How to cite

APA:

Künecke, U., Hetzner, C., Möckel, S., Yoo, H.S., Hock, R., & Wellmann, P. (2015). Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence. Thin Solid Films, 582, 387-391. https://doi.org/10.1016/j.tsf.2014.10.063

MLA:

Künecke, Ulrike, et al. "Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence." Thin Solid Films 582 (2015): 387-391.

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