Classen A, von Zanthier J, Scully MO, Agarwal GS (2017)
Publication Status: Published
Publication Type: Journal article
Publication year: 2017
Publisher: OPTICAL SOC AMER
Book Volume: 4
Pages Range: 580-587
Journal Issue: 6
We propose to use intensity correlation microscopy in combination with structured illumination to image quantum emitters that exhibit antibunching with a spatial resolution reaching far beyond the Rayleigh limit. Combining intensity measurements and intensity autocorrelations up to order m creates an effective PSF with an FWHM shrunk by the factor root m. Structured illumination microscopy, on the other hand, introduces a resolution improvement of factor 2 by use of the principle of moire fringes. Here, we show that for linear low-intensity excitation and linear optical detection, the simultaneous use of both techniques leads to a theoretically unlimited resolution power, with the improvement scaling favorably as m + root m, dependent on the correlation order m. Hence, this technique should be of interest in microscopy for imaging a variety of samples, including biological ones. We present the underlying theory and simulations, demonstrating the highly increased spatial superresolution, and point out the requirements for an experimental implementation. (C) 2017 Optical Society of America
APA:
Classen, A., von Zanthier, J., Scully, M.O., & Agarwal, G.S. (2017). Superresolution via structured illumination quantum correlation microscopy. Optica, 4(6), 580-587. https://doi.org/10.1364/OPTICA.4.000580
MLA:
Classen, Anton, et al. "Superresolution via structured illumination quantum correlation microscopy." Optica 4.6 (2017): 580-587.
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