The polLux microspectroscopy beam line at the swiss light source

Fink R, Raabe J, Quitmann C, Ade H (2007)

Publication Type: Conference contribution, Conference Contribution

Publication year: 2007


Original Authors: Flechsig U., Quitmann C., Raabe J., Boge M., Fink R., Ade H.

Publisher: American Institute of Physics

Book Volume: 879

Pages Range: 505-508


Event location: Daegu KR

DOI: 10.1063/1.2436109


The optical design and performance expectations of a Fresnel zone plate based scanning transmission x-ray microscopy (STXM) beamline at a bending magnet of the Swiss Light Source is described. The instrument allows microspectroscopy in polymer science in the water window and the study of magnetic materials with circularly polarized light. The beamline is based on a spherical grating monochromator with two gratings at a constant deviation angle and covers a photon energy range from 200 eV to 1000 eV. © 2007 American Institute of Physics.

Authors with CRIS profile

Involved external institutions

How to cite


Fink, R., Raabe, J., Quitmann, C., & Ade, H. (2007). The polLux microspectroscopy beam line at the swiss light source. In Jae-Young Choi and Seungyu Rah (Eds.), SYNCHROTRON RADIATION INSTRUMENTATION (pp. 505-508). Daegu, KR: American Institute of Physics.


Fink, Rainer, et al. "The polLux microspectroscopy beam line at the swiss light source." Proceedings of the SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation, Daegu Ed. Jae-Young Choi and Seungyu Rah, American Institute of Physics, 2007. 505-508.

BibTeX: Download