Fink R, Raabe J, Quitmann C, Ade H (2007)
Publication Type: Conference contribution, Conference Contribution
Publication year: 2007
Original Authors: Flechsig U., Quitmann C., Raabe J., Boge M., Fink R., Ade H.
Publisher: American Institute of Physics
Book Volume: 879
Pages Range: 505-508
Conference Proceedings Title: SYNCHROTRON RADIATION INSTRUMENTATION
DOI: 10.1063/1.2436109
The optical design and performance expectations of a Fresnel zone plate based scanning transmission x-ray microscopy (STXM) beamline at a bending magnet of the Swiss Light Source is described. The instrument allows microspectroscopy in polymer science in the water window and the study of magnetic materials with circularly polarized light. The beamline is based on a spherical grating monochromator with two gratings at a constant deviation angle and covers a photon energy range from 200 eV to 1000 eV. © 2007 American Institute of Physics.
APA:
Fink, R., Raabe, J., Quitmann, C., & Ade, H. (2007). The polLux microspectroscopy beam line at the swiss light source. In Jae-Young Choi and Seungyu Rah (Eds.), SYNCHROTRON RADIATION INSTRUMENTATION (pp. 505-508). Daegu, KR: American Institute of Physics.
MLA:
Fink, Rainer, et al. "The polLux microspectroscopy beam line at the swiss light source." Proceedings of the SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation, Daegu Ed. Jae-Young Choi and Seungyu Rah, American Institute of Physics, 2007. 505-508.
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