Angermeier J, Ziener D, Glaß M, Teich J (2011)
Publication Type: Conference contribution
Publication year: 2011
Publisher: IEEE Computer Society
Edited Volumes: Proceedings - 21st International Conference on Field Programmable Logic and Applications, FPL 2011
City/Town: New York, NY, USA
Pages Range: 277-281
Conference Proceedings Title: Proceedings of the International Conference on Field-Programmable Logic and Applications
ISBN: 978-1-4577-1484-9
DOI: 10.1109/FPL.2011.56
A lot of research has been spent on improving the reliability and extending the lifetime of ASIC and SoC devices, but only little on improving the long-term reliability of dynamically reconfigurable systems. In order to increase the lifetime of a reconfigurable device, we propose a placement strategy to distribute the stress equally on the reconfigurable resources at runtime such that all have a similar level of degradation. Thereby, we present a new aging model which is applied to estimate the influence of aging effects on dynamically reconfigurable devices, and which can be evaluated at runtime, while providing quite accurate aging results. Furthermore, we present a new stress-aware placement algorithm that takes the degradation of the reconfigurable resources into account and can significantly extend the lifetime of reconfigurable devices. © 2011 IEEE.
APA:
Angermeier, J., Ziener, D., Glaß, M., & Teich, J. (2011). Stress-Aware Module Placement on Reconfigurable Devices. In Proceedings of the International Conference on Field-Programmable Logic and Applications (pp. 277-281). Chania, Crete, GR: New York, NY, USA: IEEE Computer Society.
MLA:
Angermeier, Josef, et al. "Stress-Aware Module Placement on Reconfigurable Devices." Proceedings of the International Conference on Field Programmable Logic and Applications (FPL'11), Chania, Crete New York, NY, USA: IEEE Computer Society, 2011. 277-281.
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