MOS-16: A New Method for In-Fixture Calibration and Fixture Characterization

Schramm M, Schür J, Hrobak M, Schmidt LP, Konrad M (2011)

Publication Type: Conference contribution, Conference Contribution

Publication year: 2011

Event location: Baltimore US

DOI: 10.1109/ARFTG77.2011.6034560

Authors with CRIS profile

Marcus Schramm Lehrstuhl für Hochfrequenztechnik Jan Steffen Schür Lehrstuhl für Hochfrequenztechnik Michael Hrobak Lehrstuhl für Hochfrequenztechnik Lorenz-Peter Schmidt Lehrstuhl für Hochfrequenztechnik

Involved external institutions

Konrad GmbH DE Germany (DE)

How to cite

APA:

Schramm, M., Schür, J., Hrobak, M., Schmidt, L.-P., & Konrad, M. (2011). MOS-16: A New Method for In-Fixture Calibration and Fixture Characterization. In Proceedings of the ARFTG. Baltimore, US.

MLA:

Schramm, Marcus, et al. "MOS-16: A New Method for In-Fixture Calibration and Fixture Characterization." Proceedings of the ARFTG, Baltimore 2011.

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