TEM preparation method for site- and orientation-specific sectioning of individual anisotropic nanoparticles based on shadow-FIB geometry

Vieweg B, Butz B, Peukert W, Klupp Taylor R, Spiecker E (2012)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2012

Journal

Ultramicroscopy Elsevier

Publisher: Elsevier

Book Volume: 113

Pages Range: 165-170

DOI: 10.1016/j.ultramic.2011.11.015

Abstract

For the comprehensive characterization of nanoparticles cross-sectional investigation on the atomic scale by analytical and high-resolution transmission electron microscopy (TEM) is indispensable. Cross-sectioning is especially important for anisotropic nanoparticles to gain information on structure and chemistry along all important projections. We present a focused ion beam (FIB) method for site- and orientation-specific cross-sectioning of arbitrary nanoparticles that are dispersed on a substrate. By adopting a shadow geometry originally developed for thin sensitive films' protection of the specimen by a platinum layer is avoided. This enables simultaneous observation (from the front side) by the electron beam and ion-beam sectioning (from the back side of the supporting substrate) of individually selected particles with excellent accuracy on the nanometer scale. The feasibility and general applicability of the method is demonstrated by site-specific sectioning and cross-section HRTEM investigation of two types of anisotropic nanostructures: silver nanorods with five-fold twin structure and Janus-type silver patchy particles. © 2011 Elsevier B.V.

Authors with CRIS profile

Benito Vieweg
Benjamin Butz Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Wolfgang Peukert Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik Robin Klupp Taylor Professur für Nanostructured Particles Erdmann Spiecker Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Additional Organisation(s)

Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM) Exzellenz-Cluster Engineering of Advanced Materials

How to cite

APA:

Vieweg, B., Butz, B., Peukert, W., Klupp Taylor, R., & Spiecker, E. (2012). TEM preparation method for site- and orientation-specific sectioning of individual anisotropic nanoparticles based on shadow-FIB geometry. Ultramicroscopy, 113, 165-170. https://doi.org/10.1016/j.ultramic.2011.11.015

MLA:

Vieweg, Benito, et al. "TEM preparation method for site- and orientation-specific sectioning of individual anisotropic nanoparticles based on shadow-FIB geometry." Ultramicroscopy 113 (2012): 165-170.

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