Johannes Gehring

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Lehrstuhl für Leistungselektronik (LEE)
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Unpublished / Preprint

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Abstract

Journal

Investigating failure mechanisms in DC hybrid switchgear through a methodical evaluation of critical faults (2026) Bernhardt A, Streck M, Gehring J, Schuster J, Kaiser J, Kraus M, Oehler C, et al. Journal article Delays in Protection Devices and Their Effects on Selectivity: The Reaction Time Gap (2026) Gehring J, Schwanninger R, Drexler K, Wunder B, Lorentz VRH, März M Journal article