Jürgen Stahl

Professur für Optoelektronik

Automated Test Set-up for Reverse Recovery Characterization of Ultrafast Diodes (2011) Stahl J, Kübrich D, Dürbaum T Conference contribution, Conference Contribution Fully Automated Measurement Set-up for Ultra-Fast Recovery Diode Testing (2011) Stahl J, Kübrich D, Dürbaum T, Oeder C Conference contribution, Conference Contribution Output Impedance Calculation by Means of Sampled-Data Modeling (2011) Stahl J, Bucher A, Dürbaum T Conference contribution, Conference Contribution Automatic Measurement of the Reverse Recovery Behavior of Ultra-Fast Diodes (2011) Stahl J, Kübrich D, Oeder C, Pawellek A, Dürbaum T Conference contribution, Conference Contribution Balancing Unit for Proper Characterization of a Modified LISN for Effective EMI Noise Separation (2011) Stahl J, Kübrich D, Dürbaum T Conference contribution, Conference Contribution Discrepancies Caused by Approximation Methods in Case of Resonant LLC Converters with Capacitive Output Filter (2011) Oeder C, Bucher A, Stahl J, Dürbaum T Conference contribution, Conference Contribution Modification and characterization of a standard LISN for effective EMI noise separation (2010) Stahl J, Kübrich D, Dürbaum T Conference contribution, Conference Contribution Sampled-Data Modeling Applied to Output Impedance Reveals Missing Term in State-Space Averaging (2010) Stahl J, Bucher A, Oeder C, Dürbaum T Conference contribution, Conference Contribution A Comparison of Different Design Methods for the LLC Converter with Capacitive Output Filter (2010) Oeder C, Bucher A, Stahl J, Dürbaum T Conference contribution, Conference Contribution Characterization of a modified LISN for effective separated measurements of common mode and differential mode EMI noise (2010) Stahl J, Kübrich D, Bucher A, Dürbaum T Conference contribution, Conference Contribution