Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

Show on Map:


close-button

Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

A Highly Integrated EMI Filter Using Polymer Bonded Soft Magnetics as Core Material (2010) Egelkraut S, März M, Rauch M, Schletz A, Frey L Conference contribution Light-load efficiency increase in high-frequency integrated DC-DC converters by parallel dynamic width controlling (2010) Lorentz VR, Berberich SEB, März M, Bauer AJ, Ryssel H, Poure P, Braun F Journal article Audio-based Music Structure Analysis (2010) Paulus J, Müller M, Klapuri A Conference contribution Effective work function tuning in high-κ dielectric metal-oxide-semiconductor stacks by fluorine and lanthanide doping (2010) Fet A, Haeublein V, Bauer AJ, Ryssel H, Frey L Journal article The Impact of Helium Co-Implantation on Hydrogen Induced Donor Profiles in Float Zone Silicon (2010) Laven J, Job R, Schulze HJ, Niedernostheide FJ, Häublein V, Schulze H, Schustereder W, et al. Journal article Modeling of the effective work function instability in metal/high-κ dielectric stacks (2010) Fet A, Haeublein V, Bauer AJ, Ryssel H, Frey L Journal article Full wafer microlens replication by UV imprint lithography (2010) Schmitt H, Rommel M, Bauer A, Frey L, Bich A, Eisner M, Voelkel R, Hornung M Journal article NMOS logic circuits using 4H-SiC MOSFETs for high temperature applications (2010) Le-Huu M, Schrey F, Grieb M, Schmitt H, Haeublein V, Bauer A, Ryssel H, Frey L Authored book, Volume of book series Honeycomb voids due to ion implantation in germanium (2010) Kaiser RJ, Koffel S, Pichler P, Bauer AJ, Amon B, Claverie A, Benassayag G, et al. Journal article, Original article Future challenges in CMOS process modeling (2010) Pichler P, Burenkov A, Lorenz J, Kampen C, Frey L Journal article, Original article