Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes (2025) Kinstler A, Neumann R, Taylor AA, Besendörfer S, Meißner E, Weingärtner R, Brunner F, et al. Journal article Scientific Machine Learning (SciML) - How the Fusion of AI and Physics is Giving Rise to Promising Simulation Methodologies (2025) Rosskopf A, Cheng X, Straub C, Tenbrinck D Conference contribution A Path to Configurable Solid State Transformers and Energy Routers: Introduction to Modular Active Cell Control (2025) Schwanninger R, Stöcklein N, Weitz N, Yang X, März M Journal article Impedance Measurement in DC-Grids Using Central Excitation and Distributed Measurement (2025) Schwanninger R, Bosch M, Wunder B, März M Conference contribution Enhancing Dynamic Performance of Asymmetrical CLLC Resonant Converters by Optimal Trajectory Control and First Harmonic Approximation (2025) Yang X, Liu Z, Wunder B, Lorentz VRH, März M Conference contribution Fault Detection and Mitigation of DC/DC Converters with Semiconductor-Based Isolation for DC-EVSEs (2025) Drexler K, Zhou Y, Wunder B, Lorentz V, März M Conference contribution Selectivity in DC-Microgrids: The Reaction Time Gap (2025) Gehring J, Schwanninger R, Drexler K, Wunder B, Lorentz VRH, März M Conference contribution Low Cost Arc Preventer for Converting AC Devices for DC Supply (2025) Schwanninger R, Drexler K, Rohmer R, Renner CJ, Lorentz V, März M Conference contribution Überstrom-Detektions- und Begrenzungseinheit - Kurzschluss-Erkennung und strombegrenzendes Halbleiter-Schalten in < 1 µs (2025) Gehring J, Schwanninger R, Nowak A, Wunder B, Lorentz V, März M Conference contribution, Conference Contribution Modeling the partially detected backside reflectance of transparent substrates in reflectance microspectroscopy (2025) Schwarz J, Dick J, Beuer S, Rommel M, Hutzler A Journal article