Ain Shams University
University / College
Location:
Kairo,
Egypt (EG)
ISNI: 0000000406211570
ROR: https://ror.org/00cb9w016
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Investigation of capacitance voltage characteristics of strained Si/SiGe n-channel MODFET varactor (2016)
Elogail Y, Kasper E, Gunzer F, Shaker A, Schulze J
Journal article
No-reference wavelet based retinal image quality assessment (2016)
Abdel Hamid LS, El-Rafei A, El-Ramly S, Michelson G, Hornegger J
Conference contribution, Conference Contribution
Retinal image quality assessment based on image clarity and content (2016)
Abdel-Hamid L, El-Rafei A, El-Ramly S, Michelson G, Hornegger J
Journal article