Siemens AG

Industry / private company


Location: München, Erlangen, Nürnberg, Germany (DE) DE

ISNI: 000000012178835X

ROR: https://ror.org/059mq0909

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Enhanced X-Ray Inspection of Solder Joints in SMT Electronics Production using Convolutional Neural Networks (2020) Schmidt K, Thielen N, Voigt C, Seidel R, Franke J, Milde Y, Bonig J, Beitinger G Conference contribution Mining customer satisfaction on b2b online platforms using service quality and web usage metrics (2020) Figalist I, Dieffenbacher M, Eigner I, Bosch J, Olsson HH, Elsner C Conference contribution Benchmark of automated machine learning with state-of-the-art image segmentation algorithms for tool condition monitoring (2020) Lutz B, Reisch R, Kißkalt D, Avci B, Regulin D, Knoll A, Franke J Journal article, Original article Building Blocks for Digitally Integrated Process Chains in PBF-Based Additive Manufacturing (2020) Sjarov M, Ceriani N, Lechler T, Franke J Book chapter / Article in edited volumes Intuitive, VR- and Gesture-based Physical Interaction with Virtual Commissioning Simulation Models (2020) Metzner M, Krieg L, Krüger D, Ködel T, Franke J Book chapter / Article in edited volumes Appearance Learning for Image-based Motion Estimation in Tomography (2020) Preuhs A, Manhart M, Roser P, Hoppe E, Huang Y, Psychogios M, Kowarschik M, Maier A Journal article On Modeling the Physical World as a Collection of Things: The W3C Thing Description Ontology (2020) Charpenay V, Käbisch S Book chapter / Article in edited volumes Ein Ansatz zu Qualitätsvorhersage mittels intelligenter SMT-Lötstelleninspektion durch den Einsatz von Maschinellem Lernen (2020) Schmidt K, Bönig J, Beitinger G, Thielen N, Franke J Conference contribution, Conference Contribution Die systematische Entwicklung von Servicesystemen im digitalen Zeitalter – Ein Fakten-basierter Ansatz (2020) Höckmayr B, Roth A, Genenning SM, Boukhris A, Möslein K, Kalb D, Arnhold D, et al. Book chapter / Article in edited volumes Power Cycle Testing at Low Temperature Swings – Evaluating the Stability of SAC- and SnSb-based Chip Solder Layers (2020) Schmidt R, Kaesbauer M, Sippel M, Dreher P Conference contribution