Department Elektrotechnik-Elektronik-Informationstechnik (EEI)

A frequency domain approach to complete modal synthesis (2000) Deutscher J, Hippe P Conference contribution Vollständige Modale Synthese im Frequenzbereich (2000) Deutscher J, Hippe P Journal article, Original article Wafer Conserving Full Range Construction Analysis for IC Fabrication and Process Development Based on FIB /Dual Beam Inline Application (2000) Weiland R, Boit C, Dawes N, Dzieslaty A, Demm E, Ebersberger B, Frey L, et al. Conference contribution, Conference Contribution Phosphorus Ion Shower Implantation for special power IC applications (2000) Kröner F, Schork R, Frey L, Burenkov A, Ryssel H Conference contribution, Conference Contribution Investigation of molybdenum contamination in 11B+ and 31P+ implants (2000) Funk K, Häublein V, Chakor H, Ameen M, Frey L, Ryssel H, Ramirez A Conference contribution, Conference Contribution Gate oxide damage due to through the gate implantation in MOS-structures with ultrathin and standard oxides (2000) Jank M, Lemberger M, Frey L, Ryssel H Conference contribution, Conference Contribution Enhanced depth-resolution analysis with medium energy ion scattering (meis) for shallow junction profiling (2000) Tajima J, Park Y, Fujita M, Takai M, Schork R, Frey L, Ryssel H Conference contribution, Conference Contribution Defects and gallium - Contamination during focused ion beam micro machining (2000) Lehrer C, Frey L, Petersen S, Mizutam M, Takai M, Ryssel H Conference contribution, Conference Contribution MEMSTIC - Eine neue Schaltungstechnologie fuer den Submillimeter-Wellenlängenbereich (2000) Brand H, Weinzierl J Journal article, Review article Sensitive Simultaneous Detection of CO and CO$_2$ with Commercial DFB Diode Lasers for Optical Communication Systems (2000) Engelbrecht R, Brand H, Schmidt LP Conference contribution, Conference Contribution