Department Elektrotechnik-Elektronik-Informationstechnik (EEI)

Impurity incorporation during beam assisted processing analyzed using nuclear microprobe (1999) Park Y, Takai M, Lehrer C, Frey L, Ryssel H Journal article, Original article Investigation of Cu films by focused ion beam induced deposition using nuclear microprobe (1999) Park Y, Takai M, Lehrer C, Frey L, Ryssel H Journal article, Original article Comparison of beam-induced deposition using ion microprobe (1999) Park Y, Nagai T, Takai M, Lehrer C, Frey L, Ryssel H Journal article, Review article Nano-slit probes for near-field optical microscopy fabricated by focused ion beams (1999) Danzebrink H, Dziomba T, Sulzbach T, Ohlsson O, Lehrer C, Frey L Journal article, Original article Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM) (1999) Dziomba T, Sulzbach T, Ohlsson O, Lehrer C, Frey L, Danzebrink H Journal article, Original article Nonlinear acoustic echo cancellation with 2nd order adaptive Volterra filters (1999) Stenger A, Trautmann L, Rabenstein R Conference contribution, Original article Classification of time delay estimates for robust speaker localization (1999) Strobel N, Rabenstein R Conference contribution, Original article Digital Watermarking of Text, Image, and Video Documents (1998) Su J, Hartung F, Girod B Journal article A fully integrated VCO at 2 GHz (1998) Zannoth M, Kolb B, Fenk J, Weigel R Journal article A robust ultra-broad-band wireless communication system using SAW chirped delay lines (1998) Springer A, Weigel R, Pohl A, Gugler W, Huemer M, Reindl L, Ruppel C, Seifert F Journal article