Department Elektrotechnik-Elektronik-Informationstechnik (EEI)

Contamination control and ultrasensitive chemical analysis (1993) Ryssel H, Frey L, Streckfuss N, Schork R, Kroninger F, Falter T Journal article, Original article Application of advanced contamination analysis for qualification of wafer handling systems and chucks (1993) Kroninger F, Streckfuss N, Frey L, Falter T, Ryzlewicz C, Pfitzner L, Ryssel H Journal article, Original article A novel delineation technique for 2D-profiling of dopants in crystalline silicon (1993) Gong L, Frey L, Bogen S, Ryssel H Journal article, Original article Analysis of microstructured samples by focused ion beam sample preparation (1993) Frey L, Ergele W, Falter T, Gong L, Ryssel H Journal article, Original article Flinke Hochleistungs-Metallschichtsicherungen - Experimente und Simulation (1993) Luther M Thesis 3D-TLM-Modeling of Bi-Quadratic Coplanar Waveguide Taper for Picosecong Applications (1993) Weigel R, Isele B, Stöckeler F, Thomann W, Russer P Conference contribution YBCO Superconducting Microwave Components, Applied Superconductivity (1993) Weigel R, Valenzuela A, Russer P Conference contribution An X-band phased array microwave/photonic beamforming network (1993) Kirsch F, Banerjee S, Zimmer G, Feldle H, Marten P, Schmidt LP Conference contribution SAR Measurements of Coaxial Antennas in a Muscle Equivalent Water Phantom (1993) Erb J, Engelbrecht R, Schaller G, Seegenschmiedt H, Fietkau R, Sauer R, Ross D Conference contribution Koplanare hochtemperatursupraleitende Hochfrequenzkomponenten (1993) Weigel R, Valenzuela A, Russer P Conference contribution