Lehrstuhl für Elektronische Bauelemente

Extracting activation and compensation ratio from aluminum implanted 4H-SiC by modeling of resistivity measurements (2006) Rambach M, Frey L, Bauer A, Ryssel H Authored book, Volume of book series Untersuchung von Aufladungseffekten bei der Ionenimplantation (2006) Dirnecker T, Ryssel H Authored book Creation of E-Learning Content for Microelectronics Manufacturing (2006) Oechsner R, Pfeffer M, Pfitzner L, Ryssel H, Beer K, Boldin M, de Mey B, et al. Conference contribution Well Design in a Bulk CMOS Technology with Low Mask Count (2006) Jank M, Kandziora C, Frey L, Ryssel H Conference contribution Wafer scale characterization of interface state densities without test structures by photocurrent analysis (2005) Rommel M, Groß M, Frey L, Bauer A, Ryssel H Conference contribution, Conference Contribution Triple trench gate IGBTs (2005) Berberich SE, Bauer A, Frey L, Ryssel H Conference contribution, Conference Contribution Thin HfxTiySixO films with varying Hf to Ti contents as candidates for high-k dielectrics (2005) Bauer A, Paskaleva A, Lemberger M, Frey L, Ryssel H Conference contribution, Conference Contribution High-k Hafnium Silicate Films on Silicon and Germanium Wafers by MOCVD Using a Single-Source Precursor (2005) Lemberger M, Schön F, Dirnecker T, Jank M, Paskaleva A, Bauer A, Frey L, Ryssel H Book chapter / Article in edited volumes THz-photomixer based on quasi-ballistic transport (2005) Döhler G, Renner F, Klar O, Eckardt M, Schwanhäußer A, Malzer S, Driscoll D, et al. Journal article, Original article Ion Sputtering at Grazing Incidence for SIMS-Analysis (2005) Ryssel H, Ullrich M, Burenkov A Journal article