Lehrstuhl für Elektronische Bauelemente

600 °C Operation of a LDMOS Integrated on a 4H-SiC CMOS Platform (2025) Kammel R, Dick J, May A, Rommel M, Schulze J Conference contribution Fluoride-Induced Corrosion of Stainless Steel: A Case Study for its Application as Proton Exchange Membrane Water Electrolysis Bipolar Plate Material (2025) Fiedler L, Hoffmeister D, Ma TC, Schwarz J, Günther F, Przybilla T, Spiecker E, et al. Journal article Impact of Inhomogeneous Offcut Angles of GaN Native Substrates on Lateral Current Modulation in AlGaN Barrier Layers (2025) Faraji S, Meißner E, Besendörfer S, Miersch C, Weingärtner R, Beyer FC, Friedrich J Journal article Determination of the scattering length (Γ → L) by the electrically pumped Germanium Zener Emitter (2025) Hack M, Seidel L, Wanitzek M, Oehme M, Daus A, Schulze J, Schwarz D Journal article Emerging research directions in the field of nitride semiconductors (2025) Wostatek T, Civas EN, Zheng J, Chirala VYMR, Schimmel S Conference contribution, Abstract of a poster Growth kinetics - a key aspect of every semiconductor synthesis (2025) Chatterjee A, Wostatek T, Schimmel S Conference contribution, Abstract of a poster Self-organised ordering of scandium into basal monolayers of aluminium nitride and its implication for the growth of well-crystallized (Al,Sc)N materials for electronic devices (2025) Bläß U, Wu M, Epelbaum B, Meißner E Journal article Continuous-wave electrically pumped multi-quantum-well laser based on group-IV semiconductors (2024) Seidel L, Liu T, Concepción O, Marzban B, Kiyek V, Spirito D, Schwarz D, et al. Journal article Ge-on-Si single-photon avalanche diode using a double mesa structure (2024) Wanitzek M, Schulze J, Oehme M Journal article Modelling-Augmented Failure Diagnostics in Planar SiC MOS Devices Using TDDB Measurements (2024) Cornigli D, Schlichting H, Becker T, Larcher L, Erlbacher T, Pešić M Journal article