Lehrstuhl für Zuverlässige Schaltungen und Systeme

Selftest by μC to detect faulty capacitors (2013) Can Y, Rantisi M, Sattler S Conference contribution, Conference Contribution Testschaltung zur Messung von defekten Kondensatoren (2013) Can Y, Sattler S Conference contribution, Conference Contribution Standardized Characterisation of Device Power Supplies for Automated Test Generation and Simulation (2010) Glaser D, Müller A, Lu P, Uygur G, Helmreich K Conference contribution The Best of Both Worlds: Merging the Benefits of Rack&Stack and Universal ATE (2009) Lu P, Glaser D, Uygur G, Helmreich K Conference contribution Optimales, skalierbares Ressourcenmanagement für modulare, gemischt analog-digitale Testsysteme (2009) Uygur G, Lu P, Glaser D, Weichselgartner S, Helmreich K, Sattler S, Lechner A, Brenneke A Conference contribution Mixed-Signal Test Development using Open Standard Modeling and Description Languages (2009) Lu P, Glaser D, Uygur G, Weichselgartner S, Helmreich K, Lechner A Conference contribution Bridge the Gap between Simulation and Test: An OSA-Compliant Virtual Test Environment (2009) Lu P, Glaser D, Weichslgartner S, Uygur G, Helmreich K, Lechner A Conference contribution, Conference Contribution A Novel Approach to Entirely Integrate Virtual Test into Test Development Flow (2009) Lu P, Glaser D, Uygur G, Helmreich K Conference contribution Automatischer Abgleich von Leistungskopplern (2008) Helmreich K, Uygur G Conference contribution Automatic Test Case Generation with Model Checker NuSMV (2006) Bunin G, Schneider A, Haubelt C, Langer J, Heinkel U Conference contribution