IEEE Transactions on Electromagnetic Compatibility

Journal Abbreviation: IEEE T ELECTROMAGN C
ISSN: 0018-9375
Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publications (2)

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Unpublished / Preprint

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Degradation of the Conducted Radio Frequency Immunity of Microcontrollers Due to Electromagnetic Resonances in Foot-Point Loops (2011) Su T, Unger M, Steinecke T, Weigel R Journal article Using Error-Source Switching (ESS) Concept to Analyze the Conducted Radio Frequency Electromagnetic Immunity of Microcontrollers (2011) Su T, Unger M, Steinecke T, Weigel R Journal article