Journal of Applied Physics
Journal Abbreviation: J APPL PHYS
ISSN: 0021-8979
eISSN: 1089-7550
Publisher: AIP Publishing
Publications (185)
Time-resolved x-ray diffraction study of laser-induced shock and acoustic waves in single crystalline silicon (2009)
Liss KD, D'Almeida T, Kaiser M, Hock R, Magerl A, Eloy JF
Journal article
Size effects in ordered arrays of magnetic nanotubes: Pick your reversal mode (2009)
Bachmann J, Escrig J, Pitzschel K, Montero Moreno JM, Jing J, Goerlitz D, Altbir D, Nielsch K
Journal article
On the lattice parameters of silicon carbide (2009)
Stockmeier M, Müller R, Sakwe A, Wellmann P, Magerl A
Journal article
Highly p-doped regions in silicon solar cells quantitatively analyzed by small angle beveling and micro-Raman spectroscopy (2009)
Becker M, Goesele U, Hofmann A, Christiansen S
Journal article
Analytical formulation for the resonant frequency of split rings (2009)
Sydoruk O, Tatartschuk E, Shamonina E, Solymar L
Journal article
Slow waves on magnetic metamaterials and on chains of plasmonic nanoparticles: Driven solutions in the presence of retardation (2009)
Zhuromskyy O, Sydoruk O, Shamonina E, Solymar L
Journal article
Radiation stability of CsBr:Eu needle image plates (2009)
Batentschuk M, Neudert S, Weidner M, Osvet A, Struye L, Tahon JP, Leblans P
Journal article, Original article
Creation of storage centers in CsBr: Eu2+ needle image plates by vacuum ultraviolet radiation (2009)
Weidner M, Batentschuk M, Osvet A, Winnacker A, Tahon JP, Leblans P
Journal article, Original article
Interface screening and imprint in poly(vinylidene fluoride/ trifluoroethylene) ferroelectric field effect transistors (2009)
Koval Y, Lazareva I, Müller P, Müller K, Schmeisser D
Journal article, Original article
Detailed arsenic concentration profiles at Si/SiO2 interfaces (2008)
Pei L, Duscher G, Steen C, Pichler P, Ryssel H, Napolitani E, De Salvador D, et al.
Journal article, Original article