Review of Scientific Instruments
Journal Abbreviation: REV SCI INSTRUM
ISSN: 0034-6748
eISSN: 1089-7623
Publisher: AIP Publishing
Publications (53)
A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis (2019)
Wuensche M, Fuchs S, Weber T, Nathanael J, Abel JJ, Reinhard J, Wiesner F, et al.
Journal article, Review article
Correction of beam hardening in X-ray radiograms (2019)
Baur M, Uhlmann N, Pöschel T, Schröter M
Journal article
A simple high-intensity UV-photon source for photochemical studies in UHV: Application to the photoconversion of norbornadiene to quadricyclane (2019)
Schwarz M, Schuschke C, Nascimento Silva T, Mohr S, Waidhas F, Brummel O, Libuda J
Journal article
Breakthrough in neutron backscattering spectroscopy: Energy resolution improved by one order of magnitude using the GaAs 200 reflection (2019)
Kuhlmann K, Appel M, Frick B, Magerl A
Journal article
Preparation of complex model electrocatalysts in ultra-high vacuum and transfer into the electrolyte for electrochemical IR spectroscopy and other techniques (2018)
Faisal F, Bertram M, Stumm C, Waidhas F, Brummel O, Libuda J
Journal article
Setup for meV-resolution inelastic X-ray scattering measurements and X-ray diffraction at the Matter in Extreme Conditions endstation at the Linac Coherent Light Source (2018)
Mcbride EE, White TG, Descamps A, Fletcher LB, Appel K, Condamine FP, Curry CB, et al.
Journal article
A versatile apparatus for fermionic lithium quantum gases based on an interference-filter laser system (2018)
Gaenger B, Phieler J, Nagler B, Widera A
Journal article
Printed-circuit-board linear Paul trap for manipulating single nano- and microparticles (2018)
Partner HL, Zoll J, Kuhlicke A, Benson O
Journal article
Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection (2018)
Schoenke D, Oelsner A, Krautscheid P, Reeve RM, Klaeui M
Journal article
Advanced platform for the in-plane ZT measurement of thin films (2018)
Linseis V, Voelklein F, Reith H, Nielsch K, Woias P
Journal article