Thermo Fisher Scientific Spectra 200 C-FEG (Thermo Fisher Scientific Messtechnik GmbH)

The most important specifications of the TFS Spectra 200 are:

• X-CFEG emitter
• High tension: 30-200kV
• Energy resolution < 0.4 eV
• Probe Cs corrector (CEOS S-CORR)
• Point resolution for STEM: 60 pm @ 200 kV, 125 pm @ 30 kV
• Gatan spectrometer (Gatan Continuum S)
• Super-X detector G2 (EDXS)
• BF, ADF STEM and iDPC imaging: 8 segmented BF and ADF detectors (16 segments in total)
• 4k CMOS camera
• Electron tomography functionality (including EDXS)

The Spectra 200 provides high-resolution imaging as well as high-performance analytical investigation capabilities. This probe-corrected TEM enables high-resolution imaging in scanning TEM (STEM) mode for all high tensions between 30 kV and 200 kV. The ultra-high-brightness cold field emission gun (X-CFEG) with an energy resolution of < 0.4 eV in combination with a high-sensitivity SDD X-ray spectrometer (Super-X) and a high-resolution post-column energy loss spectrometer (Gatan Continuum S) creates a high-performance analytical instrument perfectly suited for the nanoanalytical characterization of all kinds of materials and devices. High-resolution electron energy-loss spectroscopy (EELS) as well as energy-dispersive X-ray spectroscopy (EDXS) yield chemical, elemental as well as bonding information even down to the atomic scale. Furthermore, the Spectra with its Ceta-S 4k high speed CMOS camera (up to 400 fps at binning 512) is used to perform advanced in situ experiments by making use of special TEM specimen holders available at CENEM. Moreover, in combination with simultaneous STEM imaging, the Spectra 200 allows for 4D-STEM investigations. A further advanced method available at the Spectra 200 is electron tomography enabling the analytical characterization of materials in three dimensions. This high-end analytical TEM enables to answer the most complex questions in almost all discipline of materials science and nanotechnology.