Zeiss Xradia 810 Ultra (Zeiss Carl Microscopy GmbH)
Model: 3D-Röntgenmikroskop XRadia Ultra 810
Manufacturer: Zeiss Carl Microscopy GmbH (2017)
URL: https://www.em.tf.fau.de/research/equipment/zeiss-xradia-810-ultra/
Location: Erlangen
Usage: For external users too
Pictures
DFG Key: 4070 Spezielle Röntgengeräte für Material-Analyse, Strukturforschung, Werkstoff-Bestrahlung
Feature(s)
- Spatial resolution: 50-150 nm
- Field of view: 16-65 µm
- X-ray photon energy: 5.4 keV (Cr source)
- Absorption and phase contrast modes
- X-ray condenser system: Reflective ellipsoidal mirror with aperture
- X-ray objective lenses: Diffractive Fresnel zone plate objectives
- Annular Zernike phase plate
- Internal temperature control
- 1M CCD camera coupled to scintillating screen
- Rotational loading stage (> ±90°)
- Videocamera
- Tomography sample holder and software
Description
Our Xradia Ultra is a high-end x-ray microscope (XRM) providing
high-resolution imaging up to 50 nm as well as large field of view
stacks made for 3 dimensional reconstructions. With advanced optics
firstly established for synchrotron experiments, we obtain with this XRM
equal resolutions for our laboratory. The rotating chromium anode
source offers a quasi-monochromatic 5.4 keV x-ray beam due to condenser
and Fresnel zone plate lens system. Common absorption imaging yield
material mass contrast of small slices up to bulk specimen. In addition,
the Xradia Ultra includes Zernike phase contrast visualization for
porous or small mass-bandwidth samples as organic materials by edge
enhancement. Furthermore, mechanic in situ experiments are enabled by a
customized mounting stage for pressure, shear and strain stress. The
high-end XRM closes the visualisation gap between Light and Electron
Microscopy in a non-destructive way.
Involved Person(s)
Organisation(s)
Funding Sources
- Spatial resolution: 50-150 nm
- Field of view: 16-65 µm
- X-ray photon energy: 5.4 keV (Cr source)
- Absorption and phase contrast modes
- X-ray condenser system: Reflective ellipsoidal mirror with aperture
- X-ray objective lenses: Diffractive Fresnel zone plate objectives
- Annular Zernike phase plate
- Internal temperature control
- 1M CCD camera coupled to scintillating screen
- Rotational loading stage (> ±90°)
- Videocamera
- Tomography sample holder and software
Our Xradia Ultra is a high-end x-ray microscope (XRM) providing high-resolution imaging up to 50 nm as well as large field of view stacks made for 3 dimensional reconstructions. With advanced optics firstly established for synchrotron experiments, we obtain with this XRM equal resolutions for our laboratory. The rotating chromium anode source offers a quasi-monochromatic 5.4 keV x-ray beam due to condenser and Fresnel zone plate lens system. Common absorption imaging yield material mass contrast of small slices up to bulk specimen. In addition, the Xradia Ultra includes Zernike phase contrast visualization for porous or small mass-bandwidth samples as organic materials by edge enhancement. Furthermore, mechanic in situ experiments are enabled by a customized mounting stage for pressure, shear and strain stress. The high-end XRM closes the visualisation gap between Light and Electron Microscopy in a non-destructive way.