FEI Titan Themis 300 (FEI)

• Emitter X-FEG
• High tension: 60-300 kV
• Monochromator, energy resolution 0.2 eV
• Cs probe corrector (CEOS, DCOR)
• Image-side Cs corrector (CEOS, CESCOR)
• Gatan imaging filter (GIF Quantum)
• HAADF detector for Z-contrast (Fishione)
• ADF/ABF/BF detectors (FEI)
• Videocamera (Flucam)
• 4k CMOS camera (Ceta 16M)
• High-efficiency Super-X detector (EDX)
• Tomography sample holder and software
• Special TEM holders

The Titan Themis³ 300 is our high-end TEM providing high-resolution imaging as well as high performance analytical investigation capabilities. This double-aberration-corrected TEM corrects both the image and the probe forming system enabling high-resolution imaging in TEM as well as scanning TEM (STEM) mode resulting in resolution limits below 1 Å for both modes for all high tensions between 60 kV and 300 kV. The high brightness electron gun (X-FEG) equipped with a monochromator to improve the energy resolution in combination with a high-sensitivity SDD X-ray spectrometer (Super-X) and a high-resolution post-column energy filter (GIF Quantum) creates a high performance analytical instrument perfectly suited for the nanoanalytical characterization of all kinds of materials and devices. Energy filtered TEM (EFTEM) imaging, high-resolution electron energy-loss spectroscopy (EELS) as well as energy-dispersive X-ray spectroscopy (EDXS) yield chemical, elemental as well as bonding information even down to the atomic scale. Additionally information about local band gaps and plasmonics are gained by monochromated low-loss EELS investigations. Furthermore the Titan Themis³ 300 is used to perform advanced in situ experiments using special TEM specimen holders. A further advanced method available at the Titan Themis³ 300 is electron tomography enabling the analytical characterization of materials and devices in 3 dimensions. This high-end analytical TEM is used to answer the most complex questions regarding materials science.