Fundamental Insights into the Degradation and Stabilization of Thin Layer Black Phosphorus

Abellan G, Wild S, Lloret V, Scheuschner N, Gillen R, Mundloch U, Maultzsch J, Varela M, Hauke F, Hirsch A (2017)


Publication Status: Published

Publication Type: Journal article

Publication year: 2017

Journal

Publisher: AMER CHEMICAL SOC

Book Volume: 139

Pages Range: 10432-10440

Journal Issue: 30

DOI: 10.1021/jacs.7b04971

Abstract

Herein, we have developed a systematic study on the oxidation and passivation of mechanically exfoliated black phosphorus (BP). We analyzed the strong anisotropic behavior of BP by scanning Raman microscopy providing an accurate method for monitoring the oxidation of BP-via statistical Raman spectroscopy. Furthermore, different factors influencing the environmental instability of the BP, i.e., thickness, lateral dimensions or visible light illumination, have been investigated in detail. Finally, we discovered that the degradation of few-layer BP flakes of <10 nm can be suppressed for months by using ionic liquids, paving the way for the development of BP-based technologies.

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How to cite

APA:

Abellan, G., Wild, S., Lloret, V., Scheuschner, N., Gillen, R., Mundloch, U.,... Hirsch, A. (2017). Fundamental Insights into the Degradation and Stabilization of Thin Layer Black Phosphorus. Journal of the American Chemical Society, 139(30), 10432-10440. https://dx.doi.org/10.1021/jacs.7b04971

MLA:

Abellan, Gonzalo, et al. "Fundamental Insights into the Degradation and Stabilization of Thin Layer Black Phosphorus." Journal of the American Chemical Society 139.30 (2017): 10432-10440.

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