Using the infrared magnetorefractive effect to compare the magnetoresistance in (100) and (111) oriented Fe3O4 films

Thompson SM, Lazarov V, Bradley R, Deakin T, Kaeswurm B, Sterbinsky G, Cheng J, Wessels B (2010)

Publication Status: Published

Publication Type: Journal article

Publication year: 2010

Journal

Journal of Applied Physics AIP Publishing

Publisher: American Institute of Physics (AIP)

Book Volume: 107

Journal Issue: 9

DOI: 10.1063/1.3350911

Abstract

The infrared magnetorefractive effect (MRE) is used to compare the magnetoresistance (MR) in epitaxial thin films of Fe3O4 grown on MgO with (100) and (111) crystal orientations. The smaller MRE detected in the (111) film is shown to correlate with the smaller electrically measured MR, its behavior consistent with a lower density of antiphase boundaries in the (111) film (C) 2010 American Institute of Physics. [doi:10.1063/1.3350911]

Authors with CRIS profile

Barbara Kaeswurm

Involved external institutions

University of York GB United Kingdom (GB) Northwestern University US United States (USA) (US)

How to cite

APA:

Thompson, S.M., Lazarov, V., Bradley, R., Deakin, T., Kaeswurm, B., Sterbinsky, G.,... Wessels, B. (2010). Using the infrared magnetorefractive effect to compare the magnetoresistance in (100) and (111) oriented Fe3O4 films. Journal of Applied Physics, 107(9). https://dx.doi.org/10.1063/1.3350911

MLA:

Thompson, Sarah M., et al. "Using the infrared magnetorefractive effect to compare the magnetoresistance in (100) and (111) oriented Fe3O4 films." Journal of Applied Physics 107.9 (2010).

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