Statistical Analysis of IP Delay Measurements as a Basis for Network Alert Systems
Holleczek T, Venus V, Naegele-Jackson S (2009)
Publication Language: English
Publication Type: Conference contribution, Original article
Publication year: 2009
Journal
Publisher: Institute of Electrical and Electronics Engineers
Edited Volumes: IEEE International Conference on Communications
Pages Range: 1-6
Conference Proceedings Title: International Conference on Communications, ICC, 09
Event location: Dresden, Germany
ISBN: 978-1-4244-3435-0
URI: http://www.comsoc.org/confs/icc/2009/
Abstract
Measuring packet delay and packet loss through dedicated test packet streams in computer networks allows for the assessment of Quality of Service on the path the probes traverse. For this reason, active IP performance measurements have been carried out in X-WiN, Germany's National Research and Educational Network, and GÉANT2, its European counterpart, by the WiN-Labor Group of the University of Erlangen-Nuremberg for many years. This paper provides an overview of how network measurements can be interpreted using a variety of statistical concepts in order to gain insight into the state of monitored connections. The focus here is set on the analysis of One-Way Delay (OWD); the approach demonstrates how OWD can be used for the identification of network congestions and can serve as a basis for network alert systems by statistically categorizing changes in the performance metric. ©2009 IEEE.
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How to cite
APA:
Holleczek, T., Venus, V., & Naegele-Jackson, S. (2009). Statistical Analysis of IP Delay Measurements as a Basis for Network Alert Systems. In International Conference on Communications, ICC, 09 (pp. 1-6). Dresden, Germany, DE: Institute of Electrical and Electronics Engineers.
MLA:
Holleczek, Thomas, Verena Venus, and Susanne Naegele-Jackson. "Statistical Analysis of IP Delay Measurements as a Basis for Network Alert Systems." Proceedings of the International Conference on Communications, ICC, 09, Dresden, Germany Institute of Electrical and Electronics Engineers, 2009. 1-6.
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