Raman scttering in polycrystalline 3C-SiC: influence of stacking faults

Hundhausen M, Ley L (1998)

Publication Type: Journal article

Publication year: 1998

Journal

Physical Review B American Physical Society

Publisher: American Physical Society

Book Volume: 58

Pages Range: 9858

Authors with CRIS profile

Martin Hundhausen Lehrstuhl für Laserphysik Lothar Ley Naturwissenschaftliche Fakultät

How to cite

APA:

Hundhausen, M., & Ley, L. (1998). Raman scttering in polycrystalline 3C-SiC: influence of stacking faults. Physical Review B, 58, 9858.

MLA:

Hundhausen, Martin, and Lothar Ley. "Raman scttering in polycrystalline 3C-SiC: influence of stacking faults." Physical Review B 58 (1998): 9858.

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