Journal article
(Original article)


High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers


Publication Details
Author(s): Heiß W, Shrestha S, Fischer R, Matt G, Feldner P, Michel T, Osvet A, Levchuk I, Merle B, Golkar S, Chen H, Tedde SF, Schmidt O, Hock R, Ruehrig M, Göken M, Heiß W, Anton G, Brabec C
Publisher: NATURE PUBLISHING GROUP
Publication year: 2017
Volume: 11
Journal issue: 7
Pages range: 436-+
ISSN: 1749-4885
Language: English

Abstract

Lead halide perovskite semiconductors are in general known to have an inherently high X-ray absorption cross-section and a significantly higher carrier mobility than any other low-temperature solution-processed semiconductor. So far, the processing of several-hundred-micrometres-thick high-quality crystalline perovskite films over a large area has been unresolved for efficient X-ray detection. In this Article, we present a mechanical sintering process to fabricate polycrystalline methyl ammonium lead triiodide perovskite (MAPbI(3)) wafers with millimetre thickness and well-defined crystallinity. Benchmarking of the MAPbI(3) wafers against state-of-the-art CdTe detectors reveals competitive conversion efficiencies of 2,527 mu C Gy(air)(-1) cm(-2) under 70 kV(p) X-ray exposure. The high ambipolar mobility-lifetime product of 2 x 10(-4) cm(2) V-1 is suggested to be responsible for this exceptionally high sensitivity. Our findings inform a new generation of highly efficient and low-cost X-ray detectors based on perovskite wafers.



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How to cite
APA: Heiß, W., Shrestha, S., Fischer, R., Matt, G., Feldner, P., Michel, T.,... Brabec, C. (2017). High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers. Nature Photonics, 11(7), 436-+. https://dx.doi.org/10.1038/NPHOTON.2017.94

MLA: Heiß, Wolfgang, et al. "High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers." Nature Photonics 11.7 (2017): 436-+.

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