Maier F, Niedermaier I, Steinrück HP (2017)
Publication Status: Published
Publication Type: Journal article
Publication year: 2017
Publisher: AMER INST PHYSICS
Book Volume: 146
Journal Issue: 17
DOI: 10.1063/1.4982355
This perspective analyzes the potential of X-ray photoelectron spectroscopy under ultrahigh vacuum (UHV) conditions to follow chemical reactions in ionic liquids in situ. Traditionally, only reactions occurring on solid surfaces were investigated by X-ray photoelectron spectroscopy (XPS) in situ. This was due to the high vapor pressures of common liquids or solvents, which are not compatible with the required UHV conditions. It was only recently realized that the situation is very different when studying reactions in Ionic Liquids (ILs), which have an inherently low vapor pressure, and first studies have been performed within the last years. Compared to classical spectroscopy techniques used to monitor chemical reactions, the advantage of XPS is that through the analysis of their core levels all relevant elements can be quantified and their chemical state can be analyzed under well-defined (ultraclean) conditions. In this perspective, we cover six very different reactions which occur in the IL, with the IL, or at an IL/support interface, demonstrating the outstanding potential of in situ XPS to gain insights into liquid phase reactions in the near-surface region. (C) 2017 Author(s).
APA:
Maier, F., Niedermaier, I., & Steinrück, H.-P. (2017). Perspective: Chemical reactions in ionic liquids monitored through the gas (vacuum)/liquid interface. Journal of Chemical Physics, 146(17). https://dx.doi.org/10.1063/1.4982355
MLA:
Maier, Florian, Inga Niedermaier, and Hans-Peter Steinrück. "Perspective: Chemical reactions in ionic liquids monitored through the gas (vacuum)/liquid interface." Journal of Chemical Physics 146.17 (2017).
BibTeX: Download