Fuchs S, Weigel R (2017)
Publication Language: English
Publication Type: Conference contribution, Conference Contribution
Publication year: 2017
Pages Range: 29-32
Conference Proceedings Title: Tagungsband TuZ 2017
Event location: Park Inn Hotel, Lübeck
More and more complex RF-transceiver ICs demand a broad test coverage to ensure highest outgoing quality. At the same time test costs need to be reduced due to low margins in the transceiver chip business. To make more efficient usage of expensive ATE (Automated Test Environment), higher parallelism is mandatory. Quad-site testing for RF-transceiver ICs is well established in the Semiconductor-Industry. Most ATE-vendors have optimized their machines for quad-site application. Due to higher usage of built-in self-test (BIST) functionality, higher parallelism seems feasible and reasonable in economic considerations. Nevertheless for higher multi-site testing the software as well as the hardware design constraints need to be considered carefully. This paper describes the extension for Octal-site testing and the respective signal integrity constraints.
APA:
Fuchs, S., & Weigel, R. (2017). Octal-site Testing of a State-of-the-art LTE RF-Transceiver IC. In Mentor Graphics, Universität Bremen (Eds.), Tagungsband TuZ 2017 (pp. 29-32). Park Inn Hotel, Lübeck.
MLA:
Fuchs, Stephan, and Robert Weigel. "Octal-site Testing of a State-of-the-art LTE RF-Transceiver IC." Proceedings of the 29th GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, Park Inn Hotel, Lübeck Ed. Mentor Graphics, Universität Bremen, 2017. 29-32.
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