Conference contribution


Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems


Publication Details
Author(s): Aliee H, Glaß M, Teich J, Borgonovo E
Publication year: 2016
Event: 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems



How to cite
APA: Aliee, H., Glaß, M., Teich, J., & Borgonovo, E. (2016). Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems.

MLA: Aliee, Hananeh, et al. "Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems." Proceedings of the 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2016.

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