Conference contribution


Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems


Publication Details
Author(s): Aliee H, Vitzethum S, Glaß M, Teich J, Borgonovo E
Publication year: 2016
Conference Proceedings Title: Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and
Pages range: 53-56

Event details
Event: 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Event location: Connecticut
Start date of the event: 19/09/2016
End date of the event: 20/09/2016



How to cite
APA: Aliee, H., Vitzethum, S., Glaß, M., Teich, J., & Borgonovo, E. (2016). Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems. In Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and (pp. 53-56). Connecticut, US.

MLA: Aliee, Hananeh, et al. "Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems." Proceedings of the 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Connecticut 2016. 53-56.

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