Journal article


Recap of the 2016 DATE Conference & Exhibition


Publication Details
Author(s): Fanucci L, Teich J
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Publication year: 2016
Volume: 33
Journal issue: 4
Pages range: 114-117
ISSN: 0740-7475



How to cite
APA: Fanucci, L., & Teich, J. (2016). Recap of the 2016 DATE Conference & Exhibition. IEEE Design & Test of Computers, 33(4), 114-117. https://dx.doi.org/10.1109/MDAT.2016.2570223

MLA: Fanucci, Luca, and Jürgen Teich. "Recap of the 2016 DATE Conference & Exhibition." IEEE Design & Test of Computers 33.4 (2016): 114-117.

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