Journal article


Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-Chip Resilience


Publication Details
Author(s): Herkersdorf A, Aliee H, Engel M, Glaß M, Gimmler-Dumont C, Henkel J, Kleeberger VB, Kochte MA, Kühn JM, Mueller-Gritschneder D, Nassif SR, Rauchfuss H, Rosenstiel W, Schlichtmann U, Shafique M, Tahoori MB, Teich J, Wehn N, Weis C, Wunderlich HJ
Publisher: Elsevier
Publication year: 2014
Volume: 54
Journal issue: 6-7
Pages range: 1066-1074
ISSN: 0026-2714



How to cite
APA: Herkersdorf, A., Aliee, H., Engel, M., Glaß, M., Gimmler-Dumont, C., Henkel, J.,... Wunderlich, H.-J. (2014). Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-Chip Resilience. Microelectronics Reliability, 54(6-7), 1066-1074. https://dx.doi.org/10.1016/j.microrel.2013.12.012

MLA: Herkersdorf, Andreas, et al. "Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-Chip Resilience." Microelectronics Reliability 54.6-7 (2014): 1066-1074.

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