Journal article
(Online publication)


Laser focus positioning method with submicrometer accuracy


Publication Details
Author(s): Alexeev I, Strauß J, Gröschl AC, Cvecek K, Schmidt M
Publisher: Osa Optical Society of America
Publication year: 2013
Volume: 52
Journal issue: 3
Pages range: 415-421
ISSN: 0003-6935
Language: English

Abstract

Accurate positioning of a sample is one of the primary challenges in laser micromanufacturing. There are a number of methods that allow detection of the surface position; however, only a few of them use the beam of the processing laser as a basis for the measurement. Those methods have an advantage that any changes in the processing laser beam can be inherently accommodated. This work describes a direct, contact-free method to accurately determine workpiece position with respect to the structuring laser beam focal plane based on nonlinear harmonic generation. The method makes workpiece alignment precise and time efficient due to ease of automation and provides the repeatability and accuracy of the surface detection of less than 1 μm.



Focus Area of Individual Faculties


How to cite
APA: Alexeev, I., Strauß, J., Gröschl, A.C., Cvecek, K., & Schmidt, M. (2013). Laser focus positioning method with submicrometer accuracy. Applied Optics, 52(3), 415-421. https://dx.doi.org/10.1364/AO.52.000415

MLA: Alexeev, Ilya, et al. "Laser focus positioning method with submicrometer accuracy." Applied Optics 52.3 (2013): 415-421.

BibTeX: Download
Share link
Last updated on 2017-10-19 at 03:41
PDF downloaded successfully