Determination of the effective refractive index of nanoparticulate ITO layers

Baum M, Alexeev I, Latzel M, Christiansen S, Schmidt M (2013)


Publication Language: English

Publication Type: Journal article

Publication year: 2013

Journal

Publisher: Optical Society of America

Book Volume: 21

Pages Range: 22754--22761

Journal Issue: 19

DOI: 10.1364/OE.21.022754

Open Access Link: https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-21-19-22754

Abstract

Nanoparticles of transparent conducting oxides, such as indium tin oxide, can be used in printing techniques to generate functional layers for various optoelectronic devices. Since these deposition methods do not create fully consolidated films, the optical properties of such layers are expected to be notably different from those of the bulk material and should be characterized on their own. In this work we present a way to measure the effective refractive index of a particulate ITO layer by refraction of light. The obtained data points are used to identify an accurate layer model for spectroscopic ellipsometry. In this way the complex refractive index of the particle layer is determined in a wide spectral range from ultra violet to near infrared.

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How to cite

APA:

Baum, M., Alexeev, I., Latzel, M., Christiansen, S., & Schmidt, M. (2013). Determination of the effective refractive index of nanoparticulate ITO layers. Optics Express, 21(19), 22754--22761. https://dx.doi.org/10.1364/OE.21.022754

MLA:

Baum, Marcus, et al. "Determination of the effective refractive index of nanoparticulate ITO layers." Optics Express 21.19 (2013): 22754--22761.

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