Journal article


Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence


Publication Details
Author(s): Künecke U, Hetzner C, Möckel S, Yoo H, Hock R, Wellmann P
Publisher: Elsevier
Publication year: 2015
Volume: 582
Pages range: 387-391
ISSN: 0040-6090
Language: English

Abstract

We report on the microstructure analysis of kesterite (Cu2ZnSnSe4) layers from rapid thermal processing of sequential elemental layers by spatially resolved cathodoluminescence in a scanning electron microscope. Energy dispersive X-ray fluorescence, X-ray diffraction and Raman spectroscopy were carried out for the validation of the findings. Special emphasis is put on the discussion of the occurrence of the secondary phases Cu2SnSe3, Cu2Se, ZnSe and SnSe. (C) 2014 Elsevier B.V. All rights reserved.



How to cite
APA: Künecke, U., Hetzner, C., Möckel, S., Yoo, H., Hock, R., & Wellmann, P. (2015). Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence. Thin Solid Films, 582, 387-391. https://dx.doi.org/10.1016/j.tsf.2014.10.063

MLA: Künecke, Ulrike, et al. "Characterization of kesterite thin films fabricated by rapid thermal processing of stacked elemental layers using spatially resolved cathodoluminescence." Thin Solid Films 582 (2015): 387-391.

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