Article in Edited Volumes


Combining Time and Concurrency in Model-Based Statistical Testing of Embedded Real-Time Systems


Publication Details
Author(s): Homm D, Eckert J, German R
Editor(s): Springer
Title edited volumes: Software Engineering and Formal Methods
Publisher: Springer
Publishing place: Berlin Heidelberg
Publication year: 2015
Title of series: Lecture Notes in Computer Science
Volume: 9509
Conference Proceedings Title: Software Engineering and Formal Methods
Pages range: 22-31
ISBN: 978-3-662-49223-9

Event details
Event: 6th Workshop on Automating Test case design, Selection and Evaluation (ATSE 2015)
Event location: York, United Kingdom
Start date of the event: 07/09/2015
End date of the event: 08/09/2015
Language: English

Abstract

Timed usage models (TUMs) represent a model-based statistical approach for system testing of real-time embedded systems. They enable an automatic test case generation and the calculation of parameters that aid the test process. However, a classical TUM only supports sequential uses of the system under test (SUT). It is not capable of dealing with concurrency, which is required for state of the art real-time embedded systems. Therefore, we introduce TUMs with parallel regions. They also allow automatic test case generation, which is carried out similarly to classical TUMs. But, the semi-Markov process (SMP) that usually used for analysis is not suitable here. We apply Markov renewal theory and define an SMP with parallel regions, which is used to calculate parameters. We validated our analytical approach by simulations.



How to cite
APA: Homm, D., Eckert, J., & German, R. (2015). Combining Time and Concurrency in Model-Based Statistical Testing of Embedded Real-Time Systems. In Springer (Eds.), Software Engineering and Formal Methods (pp. 22-31). Berlin Heidelberg: Springer.

MLA: Homm, Daniel, Jürgen Eckert, and Reinhard German. "Combining Time and Concurrency in Model-Based Statistical Testing of Embedded Real-Time Systems." Software Engineering and Formal Methods Ed. Springer, Berlin Heidelberg: Springer, 2015. 22-31.

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