Conference contribution


Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures


Publication Details
Author(s): Abelein U, Cook A, Engelke P, Glaß M, Reimann F, Gómez L, Russ T, Teich J, Ull D, Wunderlich H
Title edited volumes: Proceedings -Design, Automation and Test in Europe, DATE
Publisher: IEEE Press
Publishing place: New York, NY, USA
Publication year: 2014
Conference Proceedings Title: Proc. of Design, Automation and Test in Europe (DATE)
Pages range: 6
ISBN: 978-3-9815370-2-4
ISSN: 1530-1591

Event details
Event: Design, Automation and Test in Europe (DATE)
Event location: Dresden
Start date of the event: 24/03/2014
End date of the event: 28/03/2014

Abstract

With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is quite cost-driven, structural diagnosis shall not deteriorate traditional design objectives. With this goal in mind, the work at hand proposes a design space exploration to integrate structural diagnostic capabilities into an E/E-architecture design. The proposed integration is performed non-intrusively, i. e., the addition and execution of tests (a) does not affect any functional applications and (b) does not require any costly changes in the communication schedules. © 2014 EDAA.



How to cite
APA: Abelein, U., Cook, A., Engelke, P., Glaß, M., Reimann, F., Gómez, L.,... Wunderlich, H. (2014). Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures. In Proc. of Design, Automation and Test in Europe (DATE) (pp. 6). New York, NY, USA: IEEE Press.

MLA: Abelein, Ulrich, et al. "Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures." Proceedings of the Design, Automation and Test in Europe (DATE), Dresden New York, NY, USA: IEEE Press, 2014. 6.

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