Conference contribution


Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures


Publication Details
Author(s): Reimann F, Glaß M, Teich J, Cook A, Gomez LR, Ull D, Wunderlich HJ, Engelke P, Abelein U
Title edited volumes: Proceedings - Design Automation Conference
Publisher: ACM Press
Publishing place: New York, NY, USA
Publication year: 2014
Conference Proceedings Title: Proc. of The 51st Annual Design Automation Conference (DAC)
Pages range: 8
ISBN: 978-1-4799-3017-3
ISSN: 0738-100X

Event details
Event: The 51st Annual Design Automation Conference (DAC)
Event location: San Francisco, CA
Start date of the event: 02/06/2014
End date of the event: 05/06/2014

Abstract

The constantly growing amount of semiconductors in au-tomotive systems increases the number of possible defect mechanisms, and therefore raises also the effort to main-tain a sufficient level of quality and reliability. A promising solution to this problem is the on-line application of struc-tural tests in key components, typically ECUs. In this work, an approach for the optimized integration of both Software-Based Self-Tests (SBST) and Built-In Self-Tests (BIST) into E/E architectures is presented. The approach integrates the execution of the tests non-intrusively, i. e., it (a) does not af-fect functional applications and (b) does not require costly changes in the communication schedules or additional com-munication overhead. Via design space exploration, opti-mized implementations with respect to multiple con icting objectives, i. e., monetary costs, safety, test quality, and re-quired execution time are derived. Copyright 2014 ACM.



How to cite
APA: Reimann, F., Glaß, M., Teich, J., Cook, A., Gomez, L.R., Ull, D.,... Abelein, U. (2014). Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures. In Proc. of The 51st Annual Design Automation Conference (DAC) (pp. 8). San Francisco, CA, US: New York, NY, USA: ACM Press.

MLA: Reimann, Felix, et al. "Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures." Proceedings of the The 51st Annual Design Automation Conference (DAC), San Francisco, CA New York, NY, USA: ACM Press, 2014. 8.

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